Title :
Characterization of paralleled super junction MOSFET devices under hardand soft-switching conditions
Author :
Huang, Xudong ; Yu, Huijie ; Lai, Jih-Sheng ; Hefner, A.R. ; Berning, D.W.
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
The super junction (SJ) MOSFET exhibits conduction and switching properties similar to those of conventional power MOSFETs. In this paper, we investigate possible benefits and problems associated with connecting SJ MOSFET in parallel for high-power applications. Measured circuit performances of paralleled SJ MOSFET devices are evaluated under hard- and soft-switching conditions. The measurements include (1) turn-on and turn-off switching voltage and current comparison, (2) gate driver resistance effects on current sharing between paralleled SJ MOSFET devices, and (3) SJ MOSFET body diode behavior under hard- and soft-switching conditions. Two test circuits are developed for paralleled SJ MOSFET evaluation. One is an auxiliary resonant snubber chopper for the near zero-voltage switching test, and the other one is an auxiliary resonant snubber inverter for the true zero-voltage condition test. Experimental results indicate that SJ MOSFET can be paralleled without the need for precise device matching if the gate drive resistances are closely matched
Keywords :
choppers (circuits); driver circuits; electric resistance; invertors; power MOSFET; resonant power convertors; snubbers; auxiliary resonant snubber chopper; auxiliary resonant snubber inverter; body diode behavior; circuit performances measurement; conduction properties; current sharing; gate driver resistance effects; hard-switching conditions; paralleled super junction MOSFET devices; soft-switching conditions; switching properties; test circuits; turn-off switching current; turn-off switching voltage; turn-on switching current; turn-on switching voltage; zero-voltage condition test; zero-voltage switching test; Circuit testing; Current measurement; Electrical resistance measurement; Joining processes; MOSFET circuits; Performance evaluation; Power MOSFET; Resonance; Snubbers; Voltage;
Conference_Titel :
Power Electronics Specialists Conference, 2001. PESC. 2001 IEEE 32nd Annual
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7067-8
DOI :
10.1109/PESC.2001.954437