• DocumentCode
    1596982
  • Title

    New simple fabrication method of matrix lens arrays using resist patterns directly as electroplating moulds

  • Author

    Horiuchi, Toshiyuki ; Ono, Hiroshi

  • Author_Institution
    Tokyo Denki Univ., Tokyo, Japan
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Feasibility of a new lens-array fabrication method was verified. In the new method, resist patterns printed by projection-exposure lithography were directly used as lens-array moulds, and they were replicated to nickel dies using electroplating. Although the mould profiles were controlled only by the projection lithography conditions, various hemispherical lens-mould profiles were obtained. As profile parameters, curvature radius, pattern height, and top-view diameter were evaluated. Curvature radius errors were less than 2.5%. The mould profiles were faithfully replicated to nickel dies by electroplating, and the mean of absolute values of surface roughness (Ra) of the nickel dies was as small as less than 50 nm. Judging from these results, the new method is feasible for fabricating precise lens-array dies of metal nickel, and the dies will be applicable for making micro-lens arrays by infusing lens materials in them.
  • Keywords
    dies (machine tools); electroplating; microfabrication; microlenses; moulding; nickel; optical arrays; optical fabrication; photoresists; replica techniques; surface roughness; Ni; curvature radius errors; electroplating moulds; hemispherical lens-mould profiles; lens materials; lens-array dies; material infusion; matrix lens array fabrication; metal nickel; nickel dies; pattern height; profile parameters; projection-exposure lithography; replica method; resist patterns; surface roughness; top-view diameter; Adaptive optics; Bleaching; Integrated optics; Microwave integrated circuits; Optical device fabrication; Substrates; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
  • Conference_Location
    Birmingham
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4673-2198-3
  • Type

    conf

  • DOI
    10.1109/NANO.2012.6321927
  • Filename
    6321927