Title :
Improved AC-DC transfer uncertainties at the NML using the PHIT/PTB thin film multijunction thermal converters
Author :
Temba, ML ; Costa, AB
Author_Institution :
Nat. Metrol. Lab., CSIR, Pretoria, South Africa
fDate :
6/21/1905 12:00:00 AM
Abstract :
The authors describe how thin-film multijunction thermal converters have been used to improve the AC-DC transfer uncertainties from ±15 ppm of the single junction thermal converters to ±3 ppm in the audio frequency range at South Africa´s National Metrology Laboratory (NML)
Keywords :
electric sensing devices; electric variables measurement; thermoelectric conversion; thin film devices; AC-DC transfer uncertainties improvement; National Metrology Laboratory; South Africa; audio frequency range; thin-film multijunction thermal converters; Analog-digital conversion; Calibration; Connectors; Frequency conversion; Manufacturing; Resistors; Thermal resistance; Transistors; Uncertainty; Voltage;
Conference_Titel :
Africon, 1999 IEEE
Conference_Location :
Cape Town
Print_ISBN :
0-7803-5546-6
DOI :
10.1109/AFRCON.1999.821857
