• DocumentCode
    1597558
  • Title

    Analytical modeling and simulation of two dimensional double gate nanoscale SOI MOSFET

  • Author

    Kushwah, Ravindra Singh ; Akashe, Shyam

  • Author_Institution
    ITM University Gwalior, India
  • fYear
    2013
  • Firstpage
    295
  • Lastpage
    300
  • Abstract
    In this paper, we introduce the unique features by modified symmetrical double-gate (DG) silicon-on-insulator (SOI) MOSFET. The leading modified structure of double gate (DG) SOI MOSFET, reduces short-channel effects (SCEs) when compared with single gate (SG) SOI MOSFET. In this model, we included the calculation of the electrical field, surface potential, drain induced barrier lowering (DIBL) and threshold voltage. A model for the drain conductance, drain current, and transconductance is also discussed. The proposed DG structure provide increases in the transconductance, drain current and reduces the electric field, drain conductance, short-channel effects (SCEs) when compared with the SG SOI MOSFET. The simulation results are predicted by Cadence Virtuoso Tool in 45nm complementary metal oxide semiconductor (CMOS) Technology.
  • Keywords
    MOSFET circuits; Reliability; Double gate; conductance; drain-induced barrier lowering (DIBL); transconductance; voltage gain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems and Control (ISCO), 2013 7th International Conference on
  • Conference_Location
    Coimbatore, Tamil Nadu, India
  • Print_ISBN
    978-1-4673-4359-6
  • Type

    conf

  • DOI
    10.1109/ISCO.2013.6481166
  • Filename
    6481166