DocumentCode
1597558
Title
Analytical modeling and simulation of two dimensional double gate nanoscale SOI MOSFET
Author
Kushwah, Ravindra Singh ; Akashe, Shyam
Author_Institution
ITM University Gwalior, India
fYear
2013
Firstpage
295
Lastpage
300
Abstract
In this paper, we introduce the unique features by modified symmetrical double-gate (DG) silicon-on-insulator (SOI) MOSFET. The leading modified structure of double gate (DG) SOI MOSFET, reduces short-channel effects (SCEs) when compared with single gate (SG) SOI MOSFET. In this model, we included the calculation of the electrical field, surface potential, drain induced barrier lowering (DIBL) and threshold voltage. A model for the drain conductance, drain current, and transconductance is also discussed. The proposed DG structure provide increases in the transconductance, drain current and reduces the electric field, drain conductance, short-channel effects (SCEs) when compared with the SG SOI MOSFET. The simulation results are predicted by Cadence Virtuoso Tool in 45nm complementary metal oxide semiconductor (CMOS) Technology.
Keywords
MOSFET circuits; Reliability; Double gate; conductance; drain-induced barrier lowering (DIBL); transconductance; voltage gain;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Systems and Control (ISCO), 2013 7th International Conference on
Conference_Location
Coimbatore, Tamil Nadu, India
Print_ISBN
978-1-4673-4359-6
Type
conf
DOI
10.1109/ISCO.2013.6481166
Filename
6481166
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