DocumentCode
1597637
Title
Dielectric Frequency Response and temperature dependence of power factor
Author
Ohlen, Matz ; Werelius, Peter
Author_Institution
Megger, Täby, Sweden
fYear
2010
Firstpage
1
Lastpage
7
Abstract
Modern technology and developments in signal acquisition and analysis techniques have provided new tools for transformer diagnostics. Of particular interest are dielectric response measurements where insulation properties of oil-paper systems can be investigated. Dielectric Frequency Response, DFR (also known as Frequency Domain Spectroscopy, FDS), was introduced more than a decade ago and has been thoroughly evaluated in a number of research projects and field tests with good results. DFR data in combination with mathematical modeling of the oil-paper insulation is proven as an excellent tool for moisture assessment. Since the modeling theory contains influence of temperature, DFR and modeling can be used to calculate the temperature dependence of the insulation system. This paper gives a background to DFR, insulation modeling and how these tools can be utilized to improve understanding of power factor temperature dependence and how this can be used for decisions on maintenance and/or replacement.
Keywords
frequency response; insulation testing; paper; power factor; power transformer insulation; transformer oil; dielectric frequency response; frequency domain spectroscopy; insulation modeling; moisture assessment; oil-paper insulation; power factor temperature dependence; signal acquisition; transformer diagnostics; Dielectric measurements; Dielectrics and electrical insulation; Frequency response; Oil insulation; Particle measurements; Power system modeling; Power transformer insulation; Reactive power; Signal analysis; Temperature dependence; DFR; FDS; dielectric frequency response; dissipation factor; frequency domain spectroscopy; power factor; temperature correction; temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
Conference_Location
San Diego, CA
ISSN
1089-084X
Print_ISBN
978-1-4244-6298-8
Type
conf
DOI
10.1109/ELINSL.2010.5549719
Filename
5549719
Link To Document