DocumentCode
159765
Title
An On-line Reliability Emulation Framework
Author
Mercati, Pietro ; Bartolini, Andrea ; Paterna, Francesco ; Benini, Luca ; Rosing, Tajana Simunic
fYear
2014
fDate
26-28 Aug. 2014
Firstpage
334
Lastpage
339
Abstract
Technology scaling made reliability a primary concern for integrated circuits. Increased power and temperature exasperate the impact of degradation phenomena and shorten processors lifetime. This issue is particularly dramatic for mobile processors, characterized by variable workload and environmental conditions. Due to the different time scales at which reliability phenomena and computation happens, state-of-theartDRM solutions are evaluated using high-level workload and system models. To enable the design of workload-aware DRM with accurate reliability models, in this work we propose a software framework for virtualizing the processors reliability.Our framework captures the effect of variable workload and environmental conditions and allows to emulate longer degradation in a short time scale. We implement the framework on a realAndroid device and exploit it to enable workload-aware DynamicReliability Management (DRM).
Keywords
integrated circuit reliability; scaling circuits; dynamic reliability management; integrated circuits; on-line reliability emulation framework; software framework; technology scaling; workload-aware DRM; Degradation; Emulation; Mathematical model; Program processors; Reliability; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Embedded and Ubiquitous Computing (EUC), 2014 12th IEEE International Conference on
Conference_Location
Milano
Type
conf
DOI
10.1109/EUC.2014.59
Filename
6962307
Link To Document