• DocumentCode
    159765
  • Title

    An On-line Reliability Emulation Framework

  • Author

    Mercati, Pietro ; Bartolini, Andrea ; Paterna, Francesco ; Benini, Luca ; Rosing, Tajana Simunic

  • fYear
    2014
  • fDate
    26-28 Aug. 2014
  • Firstpage
    334
  • Lastpage
    339
  • Abstract
    Technology scaling made reliability a primary concern for integrated circuits. Increased power and temperature exasperate the impact of degradation phenomena and shorten processors lifetime. This issue is particularly dramatic for mobile processors, characterized by variable workload and environmental conditions. Due to the different time scales at which reliability phenomena and computation happens, state-of-theartDRM solutions are evaluated using high-level workload and system models. To enable the design of workload-aware DRM with accurate reliability models, in this work we propose a software framework for virtualizing the processors reliability.Our framework captures the effect of variable workload and environmental conditions and allows to emulate longer degradation in a short time scale. We implement the framework on a realAndroid device and exploit it to enable workload-aware DynamicReliability Management (DRM).
  • Keywords
    integrated circuit reliability; scaling circuits; dynamic reliability management; integrated circuits; on-line reliability emulation framework; software framework; technology scaling; workload-aware DRM; Degradation; Emulation; Mathematical model; Program processors; Reliability; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Embedded and Ubiquitous Computing (EUC), 2014 12th IEEE International Conference on
  • Conference_Location
    Milano
  • Type

    conf

  • DOI
    10.1109/EUC.2014.59
  • Filename
    6962307