DocumentCode
1597685
Title
Toward a probe-based method for determining exfoliation energies of lamellar materials
Author
Deng, Zhao ; Smolyanitsky, Alex ; Li, Qunyang ; Feng, Xi-Qiao ; Cannara, Rachel J.
Author_Institution
Center for Nanoscale Sci. & Technol, NIST, Gaithersburg, MD, USA
fYear
2012
Firstpage
1
Lastpage
5
Abstract
We discuss a potential new measurement application based on nanotribological measurements and simulations of the model lamellar material graphite. While frictional forces always oppose motion, we have observed that friction increases with decreasing load on aged graphite using atomic force microscopy (AFM). This results in an effectively negative nanoscale coefficient of friction. The magnitude of the friction coefficient increases with tip-sample adhesion. Through molecular dynamics and finite element simulations, we have demonstrated that the negative coefficient arises from an increase in out-of-plane deformability of the top layer of graphite with lifting, and is not a result of a variation in atomic corrugation or other material property. Viscoelastic waves which dissipate energy during sliding are more easily generated in the top layer of graphite when it is partially (and reversibly) exfoliated by the AFM tip. As a consequence, the magnitude of the negative friction coefficient is determined by the ratio of the work of adhesion to the exfoliation energy, providing a potential pathway toward the use of friction force microscopy for straightforward determination of the exfoliation energies of lamellar materials.
Keywords
adhesion; atomic force microscopy; elastic deformation; finite element analysis; graphite; molecular dynamics method; nanostructured materials; sliding friction; viscoelasticity; AFM; C; atomic corrugation; atomic force microscopy; energy dissipation; exfoliation energies; exfoliation energy; finite element simulation; friction force microscopy; frictional forces; graphite lifting; lamellar materials; material property; model lamellar material graphite; molecular dynamics simulation; nanotribological measurements; nanotribological simulation; negative friction coefficient; out-of-plane deformability; probe-based method; sliding; straightforward determination; tip-sample adhesion; viscoelastic waves; Adhesives; Atomic measurements; Energy measurement; Friction; Materials; Nanoscale devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location
Birmingham
ISSN
1944-9399
Print_ISBN
978-1-4673-2198-3
Type
conf
DOI
10.1109/NANO.2012.6321953
Filename
6321953
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