Title :
Development of a material phase detection system using capacitance tomography
Author :
Smit, Q. ; Tapson, J. ; Mortimer, B.J.P.
Author_Institution :
Sch. of Electr. Eng., Cape Technikon, Cape Town, South Africa
fDate :
6/21/1905 12:00:00 AM
Abstract :
Information on the material, phase and distribution within industrial mass-transfer systems is required for system control. This paper describes the development of a versatile self-tuning capacitance/conductance sensor system that can be used as a tomographic system to image the contents within a pipeline
Keywords :
capacitance measurement; capacitive sensors; electric admittance measurement; flow measurement; tomography; AC-based lock-in detection technique; capacitance tomography; industrial mass-transfer systems; material phase detection system; pipeline contents imaging; self-tuning capacitance/conductance sensor; system control; tomographic system; Capacitance measurement; Capacitive sensors; Electrical capacitance tomography; Electrodes; Feedback circuits; Feedback loop; Fluid flow measurement; Frequency; Phase detection; Voltage;
Conference_Titel :
Africon, 1999 IEEE
Conference_Location :
Cape Town
Print_ISBN :
0-7803-5546-6
DOI :
10.1109/AFRCON.1999.821894
