DocumentCode
1598691
Title
Nano needle with buffering beam for single cell stiffness measurement by nanorobotic manipulators inside ESEM
Author
Shen, Yajing ; Nakajima, Masahiro ; Yang, Zhan ; Homma, Michio ; Fukuda, Toshio
Author_Institution
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
fYear
2012
Firstpage
1
Lastpage
4
Abstract
Single cell´s mechanical property characterization is important for the understanding of the cell´s condition and activity. In this paper, a novel nanoneedle was proposed for single cell stiffness measurement inside an environmental scanning electron microscope (ESEM). The nanoneedle with a buffering beam was fabricated from AFM (atomic force microscopy) cantilever by nano fabrication technique. The beam will deform when the needle tip touched the single cell. Therefore, the stiffness of the single cell can be calculated based on the beam deflection and the indentation on the cell surface. Here, yeast cell was chosen as the biology sample and put on the substrate inside ESEM chamber. The nanoneedle was driven by a nanorobotic manipulator, which has three degrees of freedom, i.e. X, Y and Z translation. The deformation of the nanoneedle and single cell can be got from the ESEM imaging directly. The result shows that the stiffness of a single yeast cell is around 8.7 MPa by using this nano indentation method.
Keywords
atomic force microscopy; biological techniques; biomechanics; elasticity; micromanipulators; nanofabrication; nanoindentation; needles; scanning electron microscopes; scanning electron microscopy; AFM; ESEM; atomic force microscopy; beam deflection; buffering beam; cantilever; cell surface indentation; environmental scanning electron microscope; nanofabrication technique; nanoneedle; nanorobotic manipulators; needle tip; pressure 8.7 MPa; single cell mechanical property characterization; single cell stiffness measurement; yeast cell; Atomic beams; Atomic measurements; Force;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location
Birmingham
ISSN
1944-9399
Print_ISBN
978-1-4673-2198-3
Type
conf
DOI
10.1109/NANO.2012.6321995
Filename
6321995
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