Title :
Morphological characterization of sub-micron PDMS bowl structures
Author :
Mohammadkhani, Ali ; Ostadi, Hossein ; Jiang, Kyle
Author_Institution :
Biomed. Eng. & MicrolNanotechnology Res. Centre, Univ. of Birmingham, Birmingham, UK
Abstract :
In this study, both SEM stereoscopic technique and FIB milling method are used to characterize the morphology of PDMS bowl-shaped structure. The presented structure is created via a low-cost and high-throughput modified colloidal lithographic method. 3D reconstruction through SEM stereoscopic images is used to perform volume analysis while FIB milling is used to perform cross-sectional analysis. The results show that the average value of maximum peak to valley distance is 516 nm and the average height of the pyramids is around 325 nm. This approach provides a simple and efficient way to measure the morphological parameters in nanometer-sized structures.
Keywords :
focused ion beam technology; lithography; milling; nanofabrication; nanostructured materials; polymers; scanning electron microscopy; sputter etching; surface morphology; 3D reconstruction; FIB milling method; SEM stereoscopic images; SEM stereoscopic technique; bowl shaped PDMS structure; distance 516 nm; high throughput modified colloidal lithographic method; low cost modified colloidal lithographic method; morphological characterization; nanometer sized structures; submicron PDMS bowl structures; Biomedical measurements; Electron beams; Image reconstruction; Ultrasonic variables measurement;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-4673-2198-3
DOI :
10.1109/NANO.2012.6321998