DocumentCode :
1598933
Title :
Rapid fabrication of leak-free, gate-all-around ionic field-effect transistor for control of ions in nanofluidic environment
Author :
Shin, Sangwoo ; Kim, Beom Seok ; Song, Jiwoon ; Lee, Hwanseong ; Cho, Hyung Hee
Author_Institution :
Dept. of Mech. Eng., Yonsei Univ., Seoul, South Korea
fYear :
2012
Firstpage :
1
Lastpage :
4
Abstract :
Artificial control of charged particles such as ions and molecules by external actions such as field-effect gating under nanofluidic environment is of critical technology for various promising applications such as protein control, DNA translocation, drug delivery, energy conversion, desalination, etc. In this regard, developing a facile method for fabrication of ionic field-effect transistors (iFET) over a large area may offer tremendous opportunities in fundamental research as well as innovative applications. Here, we report a rapid, cost-effective method to fabricate large-scale iFET. A simple, lithography-free two-step fabrication process which consists of sputtering and anodization was employed for fabricating large-scale iFET. A gate-all-around iFET with leak-free gate dielectric exhibited outstanding gating performance despite the large channel size. The combined gate-all-around structure with leak-free gate dielectric on a large area could yield possible breakthroughs in many areas ranging from biotechnology to energy and environmental applications.
Keywords :
DNA; anodisation; biotechnology; desalination; dielectric materials; drug delivery systems; field effect transistors; nanofluidics; proteins; sputtering; DNA translocation; anodization; artificial control; biotechnology; charged particles; desalination; drug delivery; energy conversion; field-effect gating; gate-all-around ionic field-effect transistor; ion control; leak-free gate dielectric; leak-free ionic field-effect transistor; lithography-free two-step fabrication; nanofluidic environment; protein control; sputtering; Desalination; Electric fields; Electrodes; Fabrication; Logic gates; Metals; Sputtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
ISSN :
1944-9399
Print_ISBN :
978-1-4673-2198-3
Type :
conf
DOI :
10.1109/NANO.2012.6322006
Filename :
6322006
Link To Document :
بازگشت