• DocumentCode
    1599075
  • Title

    Influence of temperature to developing processes of surface discharges in oil-paper insulation

  • Author

    Wang, Hui ; Li, Chengrong ; He, Huimin

  • Author_Institution
    Beijing Key Lab. of High Voltage & EMC, North China Electr. Power Univ., Beijing, China
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In order to study the influence of temperature on the developing processes of surface discharges in oil-paper insulation, a discharge test assembly is established to simulate the surface discharges in transformers. It consists of a surface discharge model, a test rig and a PD detection system. Long-term laboratory tests under 60 °C and 100 °C were conducted to observe the entire evaluation process of surface partial discharges from its inception to the eventual occurrence of flashover, using boosting voltage application. PD was detected by conventional impulse current (CIC) signals. Phenomena and features of surface discharges at different developing stages were observed and captured. As a result, the flashover-voltage is much lower, the initial voltage is a lot lower, and the destruction is much serious at 100°C. These features could be used as effective criteria to infer different evolutionary stages of surface discharges under different temperatures.
  • Keywords
    paper; partial discharges; surface discharges; transformer oil; CIC signals; PD detection system; conventional impulse current signals; discharge test assembly; flashover voltage; long-term laboratory tests; oil-paper insulation; surface discharge developing processes; surface discharge model; temperature 100 degC; temperature 60 degC; transformers; Assembly; Flashover; Insulation testing; Laboratories; Oil insulation; Partial discharges; Power transformer insulation; Surface discharges; System testing; Temperature; developing Processes; surface discharge; temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4244-6298-8
  • Type

    conf

  • DOI
    10.1109/ELINSL.2010.5549771
  • Filename
    5549771