Title :
Dielectric study with epoxy-based nanostructured microcomposites containing silica
Author :
Fréchette, M.F. ; Martinez, H.D. ; Savoie, S. ; Krivda, A. ; Schmidt, Lars E. ; Zegarac, D.
Author_Institution :
Hydro-Quebec, IREQ, QC, Canada
Abstract :
Material samples were prepared consisting of silica particles in an epoxy matrix. The generic compound contained a large amount of micrometric silica (e.g. 60% wt.) and a few % of nanosilica. Investigation of the microstructure of the samples showed that indeed the microcomposites exhibited a nanostructured morphology. Dielectric spectroscopy was used to compare the behavior of materials differing in composition. Posttreatment using heat was necessary to obtain a reproducible dielectric response. Dielectric features linked to the material compositions were annotated. For the case of 65-% total wt. silica, it was found that when the nanophase varies from 0 to 5%, the increase in the dielectric constant could fluctuate by as much as 10% in the low-frequency range.
Keywords :
composite materials; nanostructured materials; permittivity; resins; silicon compounds; SiO2; dielectric constant; dielectric spectroscopy; dielectric study; epoxy based nanostructured microcomposites; epoxy matrix; nanostructured morphology; Composite materials; Curing; Dielectric materials; Electrochemical impedance spectroscopy; Epoxy resins; Microstructure; Nanoparticles; Nanostructured materials; Nanostructures; Silicon compounds;
Conference_Titel :
Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-6298-8
DOI :
10.1109/ELINSL.2010.5549783