Title :
Comparison of voltage and current testing of analogue and mixed-signal circuits
Author :
Al-Qutayri, M.A.
Author_Institution :
Dept. of Electron. & Electr. Eng., De Montfort Univ., Leicester, UK
Abstract :
The author presents a time-domain testing technique for analogue and mixed-signal circuits. The circuit-under-test (CUT) is simulated by a pseudo-random-binary sequence (PRBS) signal and both the voltage and supply current (Iddq) responses are measured. Both measurements are subsequently analyzed to detect the presence of a fault and to establish which measurement achieves higher confidence in the detection. The technique can test mixed-signal circuits in a unified manner and detecting soft and catastrophic faults
Keywords :
CMOS analogue integrated circuits; CMOS integrated circuits; application specific integrated circuits; circuit analysis computing; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; time-domain analysis; transient analysis; CMOS; analogue circuits; catastrophic faults; circuit-under-test; current testing; fault detection; mixed-signal circuits; pseudo-random-binary sequence; soft faults; time-domain testing; voltage testing; Circuit faults; Circuit testing; Current measurement; Current supplies; Electrical fault detection; Fault detection; Pulse measurements; Space vector pulse width modulation; Time domain analysis; Voltage;
Conference_Titel :
ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-1375-5
DOI :
10.1109/ASIC.1993.410829
