DocumentCode :
1599862
Title :
Goos-Hanchen shift description in planar optical waveguides
Author :
Rostami, A.
Author_Institution :
Dept. Electr. Eng., Tabriz Univ., Iran
Volume :
1
fYear :
2003
Firstpage :
663
Abstract :
In this paper, using the Helmholtz wave equation and the tunneling time of a photon through an index of refraction barrier, the reflection delay time and reflection coefficient calculated and analytical expression for these quantities are introduced. It predicts that, the reflection delay time and coefficients depends on the refraction index, the thickness of barrier, the incident angle, and the incident wave frequency. Using these relations, we obtain the light penetration depths as well as horizontal shifts for reflection component of incident light to interface of two media. Our results completely describe the nature of Goos-Hanchen shifts in planar optical slab waveguides as a common device in optical integrated circuits (OIC). Also, the experimental data and our prediction completely close together.
Keywords :
Helmholtz equations; light reflection; light refraction; optical planar waveguides; refractive index; Goos-Hanchen shift description; Helmholtz wave equation; barrier thickness; horizontal shifts; incident angle; incident light; incident wave frequency; light penetration depths; optical integrated circuits; planar optical slab waveguides; planar optical waveguides; reflection coefficient; reflection component; reflection delay time; refraction barrier; refraction index; tunneling time; Delay effects; Integrated optics; Optical devices; Optical planar waveguides; Optical reflection; Optical refraction; Optical waveguides; Partial differential equations; Planar waveguides; Propagation delay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communication Technology Proceedings, 2003. ICCT 2003. International Conference on
Print_ISBN :
7-5635-0686-1
Type :
conf
DOI :
10.1109/ICCT.2003.1209168
Filename :
1209168
Link To Document :
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