DocumentCode
1599989
Title
Common mode choke investigation for low pass filter application
Author
Shafii, J. ; Chai, H. ; Gadow, R.
Author_Institution
Hamilton Sundstrand Corp., Rockford, IL, USA
fYear
2011
Firstpage
190
Lastpage
195
Abstract
We have seen in EMI tests that adding additional turns to an EMI choke of a low pass filter actually worsens the conducted emissions. The reason for this is explained and demonstrated by analysis and by Pspice modeling of the EMI filter circuit and components. It is also demonstrated that the damping resistance of the EMI filter plays a very important role in EMI conducted emissions.
Keywords
SPICE; electromagnetic interference; inductors; low-pass filters; EMI choke; EMI filter circuit; EMI tests; Pspice modeling; common mode choke investigation; low pass filter application; Capacitors; Current measurement; Inductance; Inductance measurement; Inductors; Noise; Noise measurement; common mode choke; conducted emission; electromagnetic interference; low pass filter;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
Conference_Location
Long Beach, CA, USA
ISSN
2158-110X
Print_ISBN
978-1-4577-0812-1
Type
conf
DOI
10.1109/ISEMC.2011.6038308
Filename
6038308
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