DocumentCode :
1600118
Title :
Statistical characterization of complex enclosures with distributed ports
Author :
Antonsen, T.M. ; Gradoni, G. ; Anlage, S. ; Ott, E.
Author_Institution :
Inst. for Res. in Electron. & Appl. Phys., Univ. of Maryland, College Park, MD, USA
fYear :
2011
Firstpage :
220
Lastpage :
225
Abstract :
A statistical model, the Random Coupling Model, that describes the coupling of radiation into and out of large electrical enclosures is described and generalized. Particular attention is paid to the case in which the ports are electrically large and described by multiple modes (distributed ports). We find a compact expression for a model of the enclosure impedance that can be used to generate probability distributions for fields at the enclosures ports. Results are of interest in the evaluation of power leakage in complex metallic structures and reverberation chambers, and the evaluation of the effectiveness of shielding in the presence of apertures.
Keywords :
electromagnetic shielding; probability; statistical analysis; distributed ports; electromagnetic enclosures; probability distributions; random coupling model; shielding effectiveness; statistical characterization; statistical model; Admittance; Apertures; Cavity resonators; Eigenvalues and eigenfunctions; Impedance; Integrated circuits; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
Conference_Location :
Long Beach, CA, USA
ISSN :
2158-110X
Print_ISBN :
978-1-4577-0812-1
Type :
conf
DOI :
10.1109/ISEMC.2011.6038313
Filename :
6038313
Link To Document :
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