DocumentCode :
160013
Title :
Mechanical characterization of bond wire materials in electronic devices at elevated temperatures
Author :
Lorenz, G. ; Naumann, Felix ; Mittag, M. ; Petzold, M.
Author_Institution :
Center for Appl. Microstructure diagnostics, Fraunhofer Inst. for Mech. of Mater. IWM, Halle, Germany
fYear :
2014
fDate :
16-18 Sept. 2014
Firstpage :
1
Lastpage :
6
Abstract :
Today, micro- and power electronic components are used within a rapidly increasing number of different automotive applications playing a key role within power generation and energy conversion systems. As a consequence, particularly the interconnecting materials of electronics systems are extremely challenged by harsh environment conditions like high operational temperatures, which are partially superposed by intensive mechanical loading and high thermo mechanical stresses. In order to meet the robustness and reliability demands required for industrial applications, detailed understanding of the material response regarding (visco-) elastic, plastic or creep deformation behavior as a function of temperature is necessary. In this study, elastic and plastic material properties of bond wire materials at temperatures up to 350°C have been determined by nanoindentation. Using a Voce model to consider the plastic material behavior, the applied material parameter extraction procedure was exemplarily demonstrated for three different heavy bond wire materials as a model system. The test method presented has been validated by comparing results from reference tensile testing with the deformation behavior gained from nanoindentation testing. Thus, the testing method and data evaluation procedure can also be applied to determine local material parameters in critical process- or application-affected regions of microelectronic packaging materials.
Keywords :
integrated circuit packaging; integrated circuit reliability; lead bonding; Voce model; applied material parameter extraction procedure; automotive applications; bond wire materials; creep deformation behavior; critical process; data evaluation procedure; elastic deformation behavior; elastic material properties; electronic devices; energy conversion systems; industrial applications; interconnecting materials; local material parameters; material response; mechanical characterization; mechanical loading; microelectronic components; microelectronic packaging materials; plastic deformation behavior; plastic material properties; power electronic components; power generation; reference tensile testing; reliability demands; testing method; thermomechanical stresses; Plastics; Strain; Stress; Temperature measurement; Testing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics System-Integration Technology Conference (ESTC), 2014
Conference_Location :
Helsinki
Type :
conf
DOI :
10.1109/ESTC.2014.6962748
Filename :
6962748
Link To Document :
بازگشت