DocumentCode :
1600497
Title :
Determination of minimum conductivity of graphene from contactless microwaves measurements
Author :
Sharma, Pankaj ; Gomez-Diaz, S. ; Ionescu, Adrian M. ; Perruisseau-Carrier, J.
Author_Institution :
Nanoelectron. Devices Lab., Nanolab, Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
fYear :
2012
Firstpage :
1
Lastpage :
4
Abstract :
We report a non-direct method to determine the minimum conductivity (σmin) of graphene. The proposed technique is based on the prior characterization of graphene sheet impedance at microwave frequencies using waveguides, and on the subsequent extraction of σmin from the measured scattering rate. This approach presents some advantages as compared with standard DC characterization methods, as it is inherently contactless and does not require graphene patterning. Our experimental study estimates a σmin in the range of 2e2/h-4e2/h for different samples. We also compute the density of charged impurities of our samples, and show that they are related to graphene conductivity at its Dirac point.
Keywords :
electrical conductivity; graphene; impurity states; microwave measurement; C; Dirac point; charged impurity density; contactless microwaves measurements; graphene conductivity; graphene patterning; graphene sheet impedance; microwave frequencies; minimum conductivity determination; nondirect method; scattering rate measurement; standard DC characterization method; waveguides; Conductivity measurement; Frequency measurement; Indexes; Microwave measurements; Graphene; Minimum Conductivity; Relaxation time; microwave; millimeter wave;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
ISSN :
1944-9399
Print_ISBN :
978-1-4673-2198-3
Type :
conf
DOI :
10.1109/NANO.2012.6322060
Filename :
6322060
Link To Document :
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