• DocumentCode
    1600497
  • Title

    Determination of minimum conductivity of graphene from contactless microwaves measurements

  • Author

    Sharma, Pankaj ; Gomez-Diaz, S. ; Ionescu, Adrian M. ; Perruisseau-Carrier, J.

  • Author_Institution
    Nanoelectron. Devices Lab., Nanolab, Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We report a non-direct method to determine the minimum conductivity (σmin) of graphene. The proposed technique is based on the prior characterization of graphene sheet impedance at microwave frequencies using waveguides, and on the subsequent extraction of σmin from the measured scattering rate. This approach presents some advantages as compared with standard DC characterization methods, as it is inherently contactless and does not require graphene patterning. Our experimental study estimates a σmin in the range of 2e2/h-4e2/h for different samples. We also compute the density of charged impurities of our samples, and show that they are related to graphene conductivity at its Dirac point.
  • Keywords
    electrical conductivity; graphene; impurity states; microwave measurement; C; Dirac point; charged impurity density; contactless microwaves measurements; graphene conductivity; graphene patterning; graphene sheet impedance; microwave frequencies; minimum conductivity determination; nondirect method; scattering rate measurement; standard DC characterization method; waveguides; Conductivity measurement; Frequency measurement; Indexes; Microwave measurements; Graphene; Minimum Conductivity; Relaxation time; microwave; millimeter wave;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
  • Conference_Location
    Birmingham
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4673-2198-3
  • Type

    conf

  • DOI
    10.1109/NANO.2012.6322060
  • Filename
    6322060