DocumentCode
1600555
Title
VLSI compatible parallel fabrication of scalable few electron silicon quantum dots
Author
Lin, Yun P. ; Perez-Barraza, Julia I. ; Husain, Muhammad K. ; Alkhalil, Feras M. ; Lambert, Nick ; Williams, David A. ; Ferguson, Andrew J. ; Chong, Harold M H ; Mizuta, Hiroshi
Author_Institution
Nano Res. Group, Univ. of Southampton, Southampton, UK
fYear
2012
Firstpage
1
Lastpage
4
Abstract
144 highly tuneable high density lithographically defined Si double quantum dots (DQDs) are fabricated for the first time in parallel via a scalable VLSI compatible fabrication process for the realisation of single electron qubits for quantum computing. 25 nm DQDs with less than 5 nm in dimensional variation are achieved via the use of Hydrogen silsesquioxane resist and electron beam lithography. Repeatable coulomb oscillations and coulomb diamonds signifying single electron tunneling are observed in the electrical characteristics of a Si DQD structure. This demonstrates the viability and dimensionality of our system and paves the way for single electron spin manipulation in scalable Si based systems.
Keywords
Coulomb blockade; VLSI; electron beam lithography; elemental semiconductors; quantum computing; resists; semiconductor quantum dots; silicon; single electron devices; Coulomb diamonds; Si; Si DQD structure; VLSI compatible parallel fabrication; electrical characteristics; electron beam lithography; hydrogen silsesquioxane resist; lithographically defined Si double quantum dots; quantum computing; repeatable Coulomb oscillations; scalable few electron; silicon quantum dots; single electron qubits; single electron spin manipulation; single electron tunneling; size 25 nm; Doping; Heating; Industries;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location
Birmingham
ISSN
1944-9399
Print_ISBN
978-1-4673-2198-3
Type
conf
DOI
10.1109/NANO.2012.6322063
Filename
6322063
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