• DocumentCode
    1600555
  • Title

    VLSI compatible parallel fabrication of scalable few electron silicon quantum dots

  • Author

    Lin, Yun P. ; Perez-Barraza, Julia I. ; Husain, Muhammad K. ; Alkhalil, Feras M. ; Lambert, Nick ; Williams, David A. ; Ferguson, Andrew J. ; Chong, Harold M H ; Mizuta, Hiroshi

  • Author_Institution
    Nano Res. Group, Univ. of Southampton, Southampton, UK
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    144 highly tuneable high density lithographically defined Si double quantum dots (DQDs) are fabricated for the first time in parallel via a scalable VLSI compatible fabrication process for the realisation of single electron qubits for quantum computing. 25 nm DQDs with less than 5 nm in dimensional variation are achieved via the use of Hydrogen silsesquioxane resist and electron beam lithography. Repeatable coulomb oscillations and coulomb diamonds signifying single electron tunneling are observed in the electrical characteristics of a Si DQD structure. This demonstrates the viability and dimensionality of our system and paves the way for single electron spin manipulation in scalable Si based systems.
  • Keywords
    Coulomb blockade; VLSI; electron beam lithography; elemental semiconductors; quantum computing; resists; semiconductor quantum dots; silicon; single electron devices; Coulomb diamonds; Si; Si DQD structure; VLSI compatible parallel fabrication; electrical characteristics; electron beam lithography; hydrogen silsesquioxane resist; lithographically defined Si double quantum dots; quantum computing; repeatable Coulomb oscillations; scalable few electron; silicon quantum dots; single electron qubits; single electron spin manipulation; single electron tunneling; size 25 nm; Doping; Heating; Industries;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
  • Conference_Location
    Birmingham
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4673-2198-3
  • Type

    conf

  • DOI
    10.1109/NANO.2012.6322063
  • Filename
    6322063