DocumentCode :
1600625
Title :
Analysis of internal quantum efficiency of high-brightness AlGaInP LEDs
Author :
Altieri, P. ; Eiscrt, D. ; Jaeger, A. ; Windisch, R. ; Linder, N. ; Stauss, P. ; Oberschmid, R. ; Streubel, K.
Author_Institution :
OSRAM Opto Semicond. GmbH, Regensburg, Germany
fYear :
2004
Firstpage :
13
Lastpage :
14
Abstract :
The internal quantum efficiency of light emitting diodes (LEDs) based on the AlGaInP material system was analysed. This study formulated a comparatively simple rate equation model to gain a quantitative understanding of the contributions of the different loss mechanisms. On the experimental side a series of LED structures was grown with multiple (AlxGa1-x)0.5In0.5P quantum wells embedded in In0.5Al0.5P confining layers. The emission wavelength was adjusted varying the aluminum content, from 650 nm down to 560 nm in the green spectral range. Simple test structures were processed and the optical output power measured over a certain range of operating currents and temperatures. On the other hand, in the computation of the external quantum efficiency it is important to note that due to re-absorption and re-emission of light in the active layer (´photon recycling´) the extraction efficiency becomes dependent on the internal quantum efficiency. This effect was accounted for by performing ray-tracing simulations for these specific LED structures. For small internal efficiencies the extraction efficiency decreases by a factor of 3. Including this effect in the model a good fit to the experimental data over a wide temperature and current range could be achieved.
Keywords :
III-V semiconductors; aluminium compounds; brightness; gallium compounds; indium; light emitting diodes; optical losses; quantum optics; ray tracing; semiconductor device models; semiconductor growth; semiconductor quantum wells; 650 to 560 nm; AlGaInP; AlGaInP LED; In0.5Al0.5P confining layers; external quantum efficiency; extraction efficiency; high-brightness; internal quantum efficiency; light reabsorption; light reemission; loss mechanisms; multiple quantum wells; photon recycling; rate equation model; ray-tracing simulations; Aluminum; Current measurement; Data mining; Differential equations; Light emitting diodes; Power generation; Quantum computing; Stimulated emission; Temperature distribution; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Numerical Simulation of Optoelectronic Devices, 2004. NUSOD '04. Proceedings of the 4th International Conference on
Print_ISBN :
0-7803-8530-6
Type :
conf
DOI :
10.1109/NUSOD.2004.1345089
Filename :
1345089
Link To Document :
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