DocumentCode
1600625
Title
Analysis of internal quantum efficiency of high-brightness AlGaInP LEDs
Author
Altieri, P. ; Eiscrt, D. ; Jaeger, A. ; Windisch, R. ; Linder, N. ; Stauss, P. ; Oberschmid, R. ; Streubel, K.
Author_Institution
OSRAM Opto Semicond. GmbH, Regensburg, Germany
fYear
2004
Firstpage
13
Lastpage
14
Abstract
The internal quantum efficiency of light emitting diodes (LEDs) based on the AlGaInP material system was analysed. This study formulated a comparatively simple rate equation model to gain a quantitative understanding of the contributions of the different loss mechanisms. On the experimental side a series of LED structures was grown with multiple (AlxGa1-x)0.5In0.5P quantum wells embedded in In0.5Al0.5P confining layers. The emission wavelength was adjusted varying the aluminum content, from 650 nm down to 560 nm in the green spectral range. Simple test structures were processed and the optical output power measured over a certain range of operating currents and temperatures. On the other hand, in the computation of the external quantum efficiency it is important to note that due to re-absorption and re-emission of light in the active layer (´photon recycling´) the extraction efficiency becomes dependent on the internal quantum efficiency. This effect was accounted for by performing ray-tracing simulations for these specific LED structures. For small internal efficiencies the extraction efficiency decreases by a factor of 3. Including this effect in the model a good fit to the experimental data over a wide temperature and current range could be achieved.
Keywords
III-V semiconductors; aluminium compounds; brightness; gallium compounds; indium; light emitting diodes; optical losses; quantum optics; ray tracing; semiconductor device models; semiconductor growth; semiconductor quantum wells; 650 to 560 nm; AlGaInP; AlGaInP LED; In0.5Al0.5P confining layers; external quantum efficiency; extraction efficiency; high-brightness; internal quantum efficiency; light reabsorption; light reemission; loss mechanisms; multiple quantum wells; photon recycling; rate equation model; ray-tracing simulations; Aluminum; Current measurement; Data mining; Differential equations; Light emitting diodes; Power generation; Quantum computing; Stimulated emission; Temperature distribution; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Numerical Simulation of Optoelectronic Devices, 2004. NUSOD '04. Proceedings of the 4th International Conference on
Print_ISBN
0-7803-8530-6
Type
conf
DOI
10.1109/NUSOD.2004.1345089
Filename
1345089
Link To Document