DocumentCode
1600671
Title
Mold-based compartment shielding to mitigate the intra-system coupled noise on SiP modules
Author
Chih-Ying Hsiao ; Chun-Hsiang Huang ; Chuen-De Wang ; Kuo-Hsien Liao ; Chia-Hsien Shen ; Chen-Chao Wang ; Tzong-Lin Wu
Author_Institution
Dept. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2011
Firstpage
341
Lastpage
344
Abstract
A new technology based on conformal shielding technique called compartment shielding is proposed to isolate the coupled noise between the digital and RF/analog circuits inside system-in-package (SiP) modules. The technology is realized by using a tooth-shaped metal frame to separate different functional circuits. It provides an excellent shielding effectiveness (SE) and reduces the cost, dimensions, and weight compared to the conventional solution. Based on our experience, a test vehicle is designed with a broadband near-field source to evaluate the SE from 0.1 GHz to 10 GHz. The vector network analyzer (VNA) set up with an extremely low noise floor is utilized to measure the insertion loss of the test vehicle. From the measured results, the SE reaches approximately 30 dB before the first resonance appears. The discrepancy between the simulation and measurement are dominated by the fabrication errors and the power leakage at the transitions; however, the isolation over 100 dB with the proposed shield is good enough for many commercial applications, such as hand-held devices and wireless connectivity modules.
Keywords
network analysers; shielding; system-in-package; conformal shielding; frequency 0.1 GHz to 10 GHz; insertion loss; intra-system coupled noise mitigation; mold-based compartment shielding; shielding effectiveness; system-in-package modules; tooth-shaped metal frame; vector network analyzer; Connectors; Floors; Frequency measurement; Metals; Noise; Noise measurement; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
Conference_Location
Long Beach, CA, USA
ISSN
2158-110X
Print_ISBN
978-1-4577-0812-1
Type
conf
DOI
10.1109/ISEMC.2011.6038333
Filename
6038333
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