DocumentCode :
1600735
Title :
Comparing simulation results and experimental measurements of electroluminescence phenomenon in dielectric materials
Author :
Ariffin, A. Mohd ; Tajudin, N. Mat ; Sulaiman, S. ; Thayoob, Y. H Md ; Lewin, P.L.
Author_Institution :
Dept. of Electr. Power Eng., Univ. Tenaga Nasional (UNITEN), Kajang, Malaysia
fYear :
2010
Firstpage :
1
Lastpage :
5
Abstract :
Under continuous application of high electrical stresses, the insulation system of an underground power cable is subjected to long-term degradation that can eventually cause premature breakdown of the cable. This is as a result of electronic charges being injected into the dielectric material when intense electric field is applied. These charges will then interact with polymer molecules; causing even more charges to accumulate within the vicinity of the material and thus further deterioration. The interaction of the charges can lead to the dissipation of energy in the form of photons; a process known as electroluminescence (EL). In addition to space charge probing, the measurement of EL has becoming increasingly prominent in understanding the mechanisms that contribute to the early electrical ageing of an insulating material. This paper attempts to simulate EL behaviour based on the underlying hypotheses of charge injection and bipolar recombination processes that take place within a polymer. A detailed comparison between the computation results and the experimental measurements carried out by different researchers will be discussed in order to evaluate the mechanisms responsible for this phenomenon.
Keywords :
dielectric materials; electroluminescence; power cable insulation; underground cables; EL phenomenon; bipolar recombination processes; charge injection; dielectric materials; electrical ageing; electrical stress; electroluminescence phenomenon; electronic charges; experimental measurements; insulation system; long-term degradation; polymer molecules; simulation results; space charge probing; underground power cable; Cable insulation; Degradation; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Electric breakdown; Electroluminescence; Polymers; Stress; Underground power cables; Aging; dielectric measurements; electroluminescence; prebreakdown in solids; space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
Conference_Location :
San Diego, CA
ISSN :
1089-084X
Print_ISBN :
978-1-4244-6298-8
Type :
conf
DOI :
10.1109/ELINSL.2010.5549833
Filename :
5549833
Link To Document :
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