• DocumentCode
    1601013
  • Title

    Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe

  • Author

    Liang Li ; Jingook Kim ; Hanfeng Wang ; Songping Wu ; Takita, Y. ; Takeuchi, H. ; Araki, K. ; Jun Fan

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2011
  • Firstpage
    417
  • Lastpage
    421
  • Abstract
    This paper presents a measurement-based data-processing approach to obtain parameters of multiple current components through a bulk decoupling capacitor for power integrity studies. A lab-made low-cost current probe is developed to measure the induced voltage due to the time-varying switching current. Then, a post data-processing procedure is introduced to separate and obtain the parameters of multiple current components. The results obtained by the proposed method are validated with other approaches.
  • Keywords
    capacitors; electric current measurement; probes; voltage measurement; bulk decoupling capacitor; current measurement; lab-made low-cost current probe; measurement-based data-processing approach; multiple switching current components; power integrity studies; time-varying switching current; voltage measurement; Capacitors; Current measurement; Integrated circuits; Noise; Probes; Switches; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
  • Conference_Location
    Long Beach, CA, USA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4577-0812-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2011.6038347
  • Filename
    6038347