Title :
Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe
Author :
Liang Li ; Jingook Kim ; Hanfeng Wang ; Songping Wu ; Takita, Y. ; Takeuchi, H. ; Araki, K. ; Jun Fan
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
This paper presents a measurement-based data-processing approach to obtain parameters of multiple current components through a bulk decoupling capacitor for power integrity studies. A lab-made low-cost current probe is developed to measure the induced voltage due to the time-varying switching current. Then, a post data-processing procedure is introduced to separate and obtain the parameters of multiple current components. The results obtained by the proposed method are validated with other approaches.
Keywords :
capacitors; electric current measurement; probes; voltage measurement; bulk decoupling capacitor; current measurement; lab-made low-cost current probe; measurement-based data-processing approach; multiple switching current components; power integrity studies; time-varying switching current; voltage measurement; Capacitors; Current measurement; Integrated circuits; Noise; Probes; Switches; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
978-1-4577-0812-1
DOI :
10.1109/ISEMC.2011.6038347