DocumentCode :
1601616
Title :
Absolute calibration of streaked visible spectroscopy for pyrometry measurements on Z
Author :
Bliss, David E. ; Dolan, Daniel H. ; Gomez, M.R.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2013
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. The goal of streaked visible pyrometry experiments on Z is to determine the temperature of dynamic material samples using the Plank equation dL/dλ = ε 2hc25 (ehc/λkT-1) (1). The spectral irradiance dL/dl describes the amount of power emitted per unit area per unit solid angle per unit wavelength. Ideally, an absolute calibration is used to convert the measured signal such as CCD counts or film exposure to units of spectral irradiance (W/mm2/steradian/nm). Relative calibration, where measurements at different wavelengths are proportional to radiance by the same scaling factor can be useful for determining a “color” temperature. However, even at lower temperatures a relative measurement does not constrain the temperature as accurately as an absolute measurement. At higher temperature where there is little difference in the spectral irradiance at visible wavelengths, a relative calibration fails to constrain temperature at all. We have been unable to find a broadband calibration source that is bright enough to adequately expose our streaked pyrometer in a single step. Instead, this paper describes a multistage process for absolute calibration, taking care to link each stage into a complete calibration with minimum errors.
Keywords :
calibration; temperature measurement; visible spectroscopy; CCD counts; Plank equation; broadband calibration source; color temperature; dynamic material samples; pyrometry measurements; scaling factor; spectral irradiance; streaked visible pyrometry experiments; streaked visible spectroscopy; Calibration; Laboratories; Materials; Spectroscopy; Temperature; Temperature measurement; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location :
San Francisco, CA
ISSN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2013.6635199
Filename :
6635199
Link To Document :
بازگشت