DocumentCode :
160182
Title :
Comparison of different power cycling strategies for accelerated lifetime testing of power devices
Author :
Sarkany, Zoltan ; Vass-Varnai, Andras ; Rencz, Marta
Author_Institution :
Mentor Graphics, Budapest, Hungary
fYear :
2014
fDate :
16-18 Sept. 2014
Firstpage :
1
Lastpage :
5
Abstract :
Power cycling is a widely used accelerated lifetime testing method to evaluate the reliability of power modules and discrete components. Based on the accelerated test results one can deduce the lifetime of these devices in normal operation conditions. Although, we have to be careful, because not only the initial parameters, but the control strategy used during the cycling tests may also affect the measured lifetime. In this paper we present the results of a power cycling experiment, which was carried out using three different cycling strategies. Several electrical parameters were measured in each cycle and thermal transient results were captured at regular intervals to enable evaluating how the failures evolve in the different cycling strategies.
Keywords :
insulated gate bipolar transistors; power bipolar transistors; semiconductor device reliability; semiconductor device testing; IGBT modules; accelerated lifetime testing; electrical parameters; power cycling strategies; power devices; reliability; thermal transient; Degradation; Heating; Insulated gate bipolar transistors; Junctions; Temperature measurement; Transient analysis; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics System-Integration Technology Conference (ESTC), 2014
Conference_Location :
Helsinki
Type :
conf
DOI :
10.1109/ESTC.2014.6962833
Filename :
6962833
Link To Document :
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