DocumentCode :
1601873
Title :
General considerations in the metrology of the environmental sensitivities of standard frequency generators: IEEE Standards Ctte. P1193 Working Group 6 Report
Author :
Breakiron, Lee A. ; Cutler, Len S. ; Hellwig, Helmut W. ; Vig, John R. ; Winkler, Gerno M R
Author_Institution :
US Naval Obs., Washington, DC, USA
fYear :
1992
Firstpage :
816
Lastpage :
830
Abstract :
In order to provide guidelines for standardized tests and methods for measuring and characterizing the environmental sensitivities of precision oscillators, the IEEE is preparing a standards document. As part of that effort (Project P1193), general experimental considerations and analytical techniques are reviewed. Environmental effects on precision oscillators may be evaluated by: (1) identification of relevant parameters and transducing factors through correlation and spectral analyses; (2) control or removal of systematic effects (through curve-fitting, differentiation, etc.); and (3) evaluation of residual random errors by means of two-sample variances and covariances and an error budget analysis. Given an adequate measurement system, frequency reference, and control over experimental conditions, optimal data reduction involves choices as to parameter range, sampling time, averaging process, and mathematical model
Keywords :
crystal resonators; frequency measurement; measurement standards; signal generators; IEEE Standards; averaging process; correlation; covariances; curve-fitting; differentiation; environmental sensitivities; error budget analysis; frequency reference; mathematical model; optimal data reduction; parameter range; precision oscillators; residual random errors; sampling time; spectral analyses; standard frequency generators; standardized tests; transducing factors; two-sample variances; Analysis of variance; Control systems; Curve fitting; Error correction; Guidelines; Measurement standards; Metrology; Oscillators; Spectral analysis; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
Conference_Location :
Hershey, PA
Print_ISBN :
0-7803-0476-4
Type :
conf
DOI :
10.1109/FREQ.1992.269955
Filename :
269955
Link To Document :
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