Title :
CNN based self-adjusting nonlinear filters
Author :
Rekeczky, C. ; Roska, Tamcis ; Ushida, Akio
Author_Institution :
Comput. & Autom. Inst., Hungarian Acad. of Sci., Budapest, Hungary
Abstract :
In this paper, we discuss CNN based adaptive nonlinear filters derived from robust statistic and geometry-driven diffusion paradigms. The base models of both approaches are defined as difference controlled nonlinear (DCN) CNN templates while the self-adjusting property is ensured by simple analogic (analog and logic) CNN algorithms. The proposed methods provide a practical framework for VLSI implementation, since all nonlinear cell interactions of the CNN architecture are deduced to two fundamental nonlinearities, to a sigmoid-type and a radial basis function. These nonlinear characteristics in DCN templates can be approximated by simple piecewise-linear functions of the difference voltage of neighboring cells. The simplification makes possible to convert all space invariant nonlinear templates of this study to a standard instruction set of the CNN Universal Machine, where each instruction is coded by at most 10 analog numbers. Through examples it is demonstrated, that such CNN based adaptive nonlinear filters have excellent performance in filtering both the impulsive and Gaussian noise while preserving the image structure
Keywords :
Gaussian noise; cellular neural nets; feedforward neural nets; filtering theory; geometry; image segmentation; neural chips; nonlinear filters; self-adjusting systems; smoothing methods; statistical analysis; CNN Universal Machine; CNN based self-adjusting nonlinear filters; Gaussian noise; VLSI implementation; adaptive nonlinear filters; analogic CNN algorithms; difference controlled nonlinear CNN templates; difference voltage; image structure; impulsive noise; nonlinear cell interactions; nonlinear characteristics; piecewise-linear functions; radial basis function; space invariant nonlinear templates; Cellular neural networks; Code standards; Logic; Nonlinear filters; Piecewise linear techniques; Robustness; Statistics; Turing machines; Very large scale integration; Voltage;
Conference_Titel :
Cellular Neural Networks and their Applications, 1996. CNNA-96. Proceedings., 1996 Fourth IEEE International Workshop on
Conference_Location :
Seville
Print_ISBN :
0-7803-3261-X
DOI :
10.1109/CNNA.1996.566602