DocumentCode :
160206
Title :
AR-concepts for hermetic wafer level packaging of uncooled FIR bolometer arrays
Author :
Stenchly, Vanessa ; Lofink, Fabian ; Reinert, Wolfgang
Author_Institution :
Fraunhofer Inst. for Silicon Technol., Itzehoe, Germany
fYear :
2014
fDate :
16-18 Sept. 2014
Firstpage :
1
Lastpage :
3
Abstract :
Uncooled FIR-bolometer image sensors are established in many applications like building inspections, cold bridge analyses and predictive maintenance. New fields of application are discovered, like automotive night vision, advanced presence detection, gesture recognition etc. but these require a lower cost, small form factor packaging of the μ-bolometer sensors. Wafer level packaging (WLP) is seen as the enabling housing technology compared to ceramic packages for high volume production. Monolithic integrated μ-bolometer image sensors require a vacuum packaging with vacuum level in the range of 10-3 mbar or less. The growing demand for reliability especially in automotive applications has also a large impact on the package construction. The overall challenge for high sensitive μ-bolometer sensors is to create a small package that allows for a maximum IR transmission at minimum cost. The work describes a wafer level technology on 200mm wafers with a hermetic sealing for large evacuated cavity dimensions with the process integration of different anti-reflective surface treatments. Cavities are created with 90μm thick poly-silicon frames in an additive deposition technology. The IR window region in the caps features different customer specific anti-reflective concepts. One approach is a double side moth eye pattern that can be designed to suppress short wavelength by destructive interference. It is possible to use different geometries of moth eyes in- and outside of the cavities to create a low cost filter. To reduce sunlight transmission a combination of moth eyes inside the cavities and a multi-layer filter coating outside can be achieved. The moth eyes patterns are realized in silicon wafers by reactive ion etching. To generate a high vacuum up to 10-4 mbar a getter with large exposed surface is required. A 3D structured getter solution is presented that generates a maximum getter surface in a small area in the c- p. First wafers with a good optical resolution and thermoelectric sensitivity have been achieved by a eutectic wafer bonding process.
Keywords :
bolometers; ceramic packaging; elemental semiconductors; hermetic seals; image sensors; integrated circuit reliability; monolithic integrated circuits; sensor arrays; silicon; sputter deposition; sputter etching; sputtered coatings; sunlight; surface treatment; thermoelectricity; wafer bonding; wafer level packaging; AR-concept; IR window region; Si; WLP; additive deposition technology; advanced presence detection; antireflective surface treatment; automotive night vision; building inspection; ceramic packaging; cold bridge analyses; customer specific antireflective concept; double side moth eye pattern; eutectic wafer bonding process; gesture recognition; hermetic sealing; hermetic wafer level packaging; housing technology; interference; maximum IR transmission; monolithic integrated μ-bolometer image sensor; multilayer filter coating; optical resolution; predictive maintenance; reactive ion etching; reliability; size 200 mm; size 90 mum; sunlight transmission reduce; thermoelectric sensitivity; thick polysilicon frame; uncooled FIR bolometer array; uncooled FIR-bolometer image sensor; vacuum packaging; Cavity resonators; Coatings; Gettering; Optical surface waves; Silicon; Surface treatment; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics System-Integration Technology Conference (ESTC), 2014
Conference_Location :
Helsinki
Type :
conf
DOI :
10.1109/ESTC.2014.6962844
Filename :
6962844
Link To Document :
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