Title :
Structure on the dense residual wire core during exploding wire plasma formation
Author :
Shelkovenko, T.A. ; Pikuz, S.A. ; Mingaleev, Albert R. ; Hammer, D.A.
Author_Institution :
Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA
Abstract :
Summary form only given. High resolution (1-5 micron, 0.7-2 ns) X-ray (2-4 keV) backlighting has been used to study the formation of plasma when single wire and multiwire arrays are exploded using the /spl sim/450 kA XP pulser at Cornell University. The wire plasmas were imaged using 13-25 micron Mo wire, and 20 micron Pd wire, 150-200 kA X-pinch X-ray backlighters which were <5 microns in size and about 1 ns in duration. It is well established now that an exploding wire plasma produced by a /spl sim/100 ns pulsed power generator initially consists of a relatively low density coronal plasma surrounded by a dense residual wire core. Two images of the wire cores separated in time by 5-20 ns have been obtained 40-70 ns after the start of the current pulse with 2-4 keV X-rays using different geometries. Fine structure on the wire core surface with a spatial scale of 10-20 microns has been recorded on film at times when the wire core is about ten times that diameter. The structure, which appears to be dominantly azimuthally symmetric, is reminiscent of the Rayleigh-Taylor instability, and it is observed to increase in amplitude from the first backlighter frame to the second.
Keywords :
Rayleigh-Taylor instability; exploding wires; molybdenum; palladium; pinch effect; plasma diagnostics; plasma instability; plasma production; 13 to 25 micron; 150 to 200 kA; 2 to 4 keV; 450 kA; Mo; Mo wire; Pd; Pd wire; Rayleigh-Taylor instability; X-pinch; XP pulser; dense residual wire core; exploding wire plasma formation; fine structure; high resolution X-ray backlighting; low density coronal plasma; multiwire array; pulsed power generator; single wire array; Cameras; Conductivity; Detectors; Dynamic range; Laboratories; Optical imaging; Plasma density; Plasma x-ray sources; Testing; Wire;
Conference_Titel :
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location :
Raleigh, NC, USA
Print_ISBN :
0-7803-4792-7
DOI :
10.1109/PLASMA.1998.677494