• DocumentCode
    1602216
  • Title

    Investigation of seasonal fluctuation of electrical parameters of amorphous silicon modules in ambient conditions

  • Author

    Otero, P. ; Alberte, C. ; Rodriguez, J.A. ; Vetter, Matthias ; Andreu, Jon

  • Author_Institution
    Dept. Technol., Dev. & Innovation, T-Solar Global S.A., Orense, Spain
  • fYear
    2013
  • Firstpage
    289
  • Lastpage
    292
  • Abstract
    Analysis of continuously acquired electrical data of amorphous silicon (a-Si) modules working under ambient conditions enable us to separate the effects of various factors, as e.g, module temperature, sun spectrum, ambient temperature, influencing a-Si module performance. This results in an improved understanding of the seasonal fluctuations of electric characteristics that can be expected in different ambient conditions. For the test site of Orense, seasonal oscillations lead to electrical power variation of 19% (± 9.5%) around an annual average value with a minimum around January and a maximum around mid of July. Variation of the sun spectrum has the highest impact on the outdoor performance of a-Si modules with amplitude corresponding to about 5.5%. The Staebler Wronski effect has a slightly lower influence with amplitude of about 4 %.
  • Keywords
    Staebler-Wronski effect; amorphous semiconductors; elemental semiconductors; photovoltaic power systems; solar cells; PV module; Si; Staebler Wronski effect; a-Si module performance; amorphous silicon module; electrical data; electrical parameters; electrical power variation; seasonal fluctuation; sun spectrum; Photovoltaic systems; Sun; Temperature dependence; Temperature distribution; Temperature measurement; PV module; amorphous silicon; fluctuation; outdoor; performance; power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices (CDE), 2013 Spanish Conference on
  • Conference_Location
    Valladolid
  • Print_ISBN
    978-1-4673-4666-5
  • Electronic_ISBN
    978-1-4673-4667-2
  • Type

    conf

  • DOI
    10.1109/CDE.2013.6481399
  • Filename
    6481399