DocumentCode :
1602218
Title :
Lateral field excitation and coupled modes in AT quartz: synchrotron radiation X-ray topography
Author :
Capelle, B. ; Detaint, J. ; Schwartzel, J. ; Zheng, Y. ; Zarka, A.
Author_Institution :
Univ. Pierre et Marie Curie, Paris, France
fYear :
1992
Firstpage :
553
Lastpage :
560
Abstract :
Using the synchrotron radiation delivered by a DCI storage ring, plano convex AT resonators excited by a lateral field are studied by the X-ray topography technique. Different overtones and anharmonics of the three types of the thickness modes are observed. Coupled modes in fundamental AT plane resonators are shown and the reasons for their appearance are analyzed
Keywords :
X-ray diffraction examination of materials; crystal resonators; piezoelectric oscillations; vibrations; AT quartz; SiO2; anharmonics; coupled modes; lateral field excitation crystal resonators; overtones; plano convex AT resonators; synchrotron radiation X-ray topography; thickness modes; Coordinate measuring machines; Coupled mode analysis; Couplings; Resonance; Storage rings; Surface topography; Synchrotron radiation; Visualization; X-ray diffraction; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
Conference_Location :
Hershey, PA
Print_ISBN :
0-7803-0476-4
Type :
conf
DOI :
10.1109/FREQ.1992.269969
Filename :
269969
Link To Document :
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