A fast analysis of electromagnetic immunity responses of RF amplifier circuit under CW/digital-modulation schemes

This paper presents a fast analysis of the radiated susceptibility (RS) problem associated with the microstrip amplifier, which is illuminated by a uniform plane incident wave. By using the field-equations incorporated advanced design system (ADS) commercial circuit platform, the electromagnetic immunity responses of RF amplifier circuits, especially under digital modulation scheme, may efficiently be addressed. In this study, the simulated field-induced terminal voltages of microstrip single-stage RF amplifier circuit are presented and carefully examined with the results from measurements also included for validation.