DocumentCode :
1602933
Title :
Two connectionist schemes for selecting groups of features (sensors)
Author :
Chakraborty, Debrup ; Pal, Nihil R.
Author_Institution :
Electron. & Commun. Sci. Unit, Indian Stat. Inst., Calcutta, India
Volume :
1
fYear :
2003
Firstpage :
161
Abstract :
Suppose for a given classification or function approximation (FA) problem data are collected using l sensors. From the output of the ith sensor ni features are extracted, thereby generating p = Σi=1l ni features. So for the task at hand we have X ⊂ Rp as input data along with their corresponding outputs or class labels. Here we propose two novel connectionist schemes that can select the sensors that yield redundant or bad features online and also do the required task, say, FA or classification. One of the schemes is based on the Radial Basis Function network and the other uses the Multilayered Perceptron network. Simulations show that the methods can detect the bad groups of features online and can also eliminate the effect of these bad features while doing the task.
Keywords :
feature extraction; function approximation; learning (artificial intelligence); multilayer perceptrons; radial basis function networks; bad features; connectionist schemes; four-layer feedforward network; function approximation systems; group feature selecting perceptron; groups of features selection; multilayered perceptron; radial basis function network; redundant features; Acoustic sensors; Data mining; Feature extraction; Intelligent sensors; Intelligent systems; Multilayer perceptrons; Performance analysis; Radial basis function networks; Sensor phenomena and characterization; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fuzzy Systems, 2003. FUZZ '03. The 12th IEEE International Conference on
Print_ISBN :
0-7803-7810-5
Type :
conf
DOI :
10.1109/FUZZ.2003.1209355
Filename :
1209355
Link To Document :
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