Title :
Servo system design of a high-resolution piezo-driven fine stage for step-and-repeat microlithography systems
Author :
Tsai, Kuen-Yu ; Yen, Jia-Yush
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
fDate :
6/21/1905 12:00:00 AM
Abstract :
Most microlithographic steppers use a dual stage design to achieve both large stroke and high precision motion. The fine-stage of the stepper compensates for the insufficient resolution of the coarse stage. In this design, the stepper fine-stage adjusts the semiconductor wafer position and orientation to a close to 10-nm positioning accuracy with a 10-micron motion stroke. The stage uses three sets of piezoelectric actuators to adjust the X, Y positioning and θ orientation. The servo controller positions and orients the stage to meet the specification. A multivariable system identification process indicates that there is a serious coupling among the system dynamics in different degrees of freedom. In addition, the actuators possess a non-linear hysteresis effect. A diagonal controller, based upon the linear-quadratic Gaussian algorithm, is designed to overcome the actuators´ hysteresis effect, and decouple the plant at steady state. The experimental results show that the resultant control achieves a satisfactory performance
Keywords :
linear quadratic Gaussian control; multivariable control systems; photolithography; piezoelectric actuators; position control; process control; servomechanisms; diagonal controller; dual stage design; fine stage; linear-quadratic Gaussian algorithm; multivariable system; optical stepper; piezoelectric actuator; positioning system; semiconductor wafer; servo system; step-and-repeat microlithography system; Algorithm design and analysis; Bandwidth; Hysteresis; MIMO; Mechanical engineering; Nonlinear optics; Piezoelectric actuators; Production; Servomechanisms; Steady-state;
Conference_Titel :
Industrial Electronics Society, 1999. IECON '99 Proceedings. The 25th Annual Conference of the IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-5735-3
DOI :
10.1109/IECON.1999.822161