Title :
Cooling and shielding systems for infrared detectors - requirements and limits
Author_Institution :
Inst. of Electron., Tech. Univ. Lodz
fDate :
6/27/1905 12:00:00 AM
Abstract :
This paper presents three main cooling systems used for infrared detectors. At first thermoelectric devices are discussed. They allow cooling down the detector with low efficiency and not to the very low temperature. They do not generate any vibrations and therefore are suitable for thermal detectors, where the microphone effect can decrease their performance. Photon detectors need to be cooled down even to 77K or better. The only way to have such deep cooling is to use the cooler based on thermodynamic cycle such as Stirling one. With the high efficiency one can easily obtain cryogenic temperature for a detector. The electromagnetic noise and vibration generation are the main disadvantages of using such devices. Joule-Thomson effect during gas expansion is 3rd cooling system discussed in the paper. It is highly effective process, used for gas liquefaction too. The working gas is being removed during cooling into the atmosphere, so the need of continuous supplying with compressed one, what makes this system very difficult for remote applications. In the paper, simple calculations are presented to illustrate the advantages and disadvantages of the different cooling systems
Keywords :
Joule-Thomson effect; Stirling engines; cooling; infrared detectors; liquefaction; thermoelectric devices; Joule-Thomson effect; cooling systems; cryogenic temperature; electromagnetic noise; gas expansion; gas liquefaction; infrared detectors; photon detectors; shielding systems; thermal detectors; thermodynamic cycle; thermoelectric devices; vibration generation; Cooling; Cryogenics; Electromagnetic devices; Electromagnetic interference; Infrared detectors; Microphones; Noise generators; Temperature; Thermodynamics; Thermoelectric devices; IR detector; Peltier Joule-Thomphon cooliong; Stirling;
Conference_Titel :
Engineering in Medicine and Biology Society, 2005. IEEE-EMBS 2005. 27th Annual International Conference of the
Conference_Location :
Shanghai
Print_ISBN :
0-7803-8741-4
DOI :
10.1109/IEMBS.2005.1616489