Title :
Signal parameter algorithms for trend analysis of digital data acquisition systems
Author :
Lee, Jonathan W.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Abstract :
A description is given of three integrated Fortran routines that calculate a comprehensive set of characterization parameters for any uniformly sampled discrete-time signal. The parameters and algorithms are based on IEEE Standard 194-1977, Pulse Terms and Definitions and IEEE Standard 181-1977, Pulse Measurement and Analysis by Objective Techniques. These subroutines are used extensively for trend analysis of the performance of digital data acquisition systems in the Nevada Test Site field instrumentation system. The algorithms are designed to be independent of pulse shape and polarity
Keywords :
computerised instrumentation; computerised signal processing; data acquisition; electrical engineering computing; performance evaluation; standards; time series; IEEE Standard 181-1977; IEEE Standard 194-1977; integrated Fortran routines; multichannel system; performance; signal parameter algorithms; subroutines; trend analysis of digital data acquisition; uniformly sampled discrete-time signal; wall clock response time; waveform shape; Algorithm design and analysis; Data acquisition; Data analysis; Instruments; Measurement standards; Performance analysis; Pulse measurements; Pulse shaping methods; Signal analysis; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
DOI :
10.1109/IMTC.1991.161649
