• DocumentCode
    1603201
  • Title

    A novel imaging method for the impedance calculation of power and ground planes

  • Author

    De-Cao Yang ; Xing-Chang Wei ; Er-Ping Li

  • Author_Institution
    Dept. of Inf. Sci. & Electron. Eng., Zhejiang Univ., Hangzhou, China
  • fYear
    2011
  • Firstpage
    883
  • Lastpage
    887
  • Abstract
    Power and ground planes are the major noise sources in the electronic package and multi-layered printed circuit boards. We propose a novel imaging method to simulate the impedance of power and ground planes. In the proposed method, the noise propagation between the power and ground planes is equivalent to a two-dimensional transverse magnetic problem. The electromagnetic wave multi reflections from the periphery of the power and ground planes are represented by the images of the source current, then a two-dimensional Green´s function is used to efficiently calculate the contributions from the source and all its images. The major advantage of the proposed imaging method over the available mode expansion method is that it converges quickly at high frequencies, and it can be easily extended to simulate power and ground planes with arbitrary shapes. By the comparison with the full-wave method and measurement results, the accuracy and efficiency of the proposed imaging method are validated.
  • Keywords
    Green´s function methods; circuit noise; electromagnetic interference; electromagnetic wave propagation; electronics packaging; printed circuits; Green´s function; electromagnetic wave multireflections; electronic package; ground planes; imaging method; impedance calculation; multi-layered printed circuit boards; noise propagation; noise sources; power planes; two-dimensional transverse magnetic problem; Cavity resonators; Imaging; Impedance; Mathematical model; Noise; Software; Substrates; Power-ground planes; imaging method; power integrity and signal integrity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
  • Conference_Location
    Long Beach, CA, USA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4577-0812-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2011.6038433
  • Filename
    6038433