Title :
A concise study on luminescence of dealuminated faujasite and the formation of nanoclusters in the zeolite host structure
Author :
Job, R. ; Fahrner, R. ; Yoshida, A.
Author_Institution :
Dept. of Electr. Eng., Hagen Univ., Germany
fDate :
6/21/1905 12:00:00 AM
Abstract :
Strong cathodoluminescence (CL) in the blue spectral range was observed in dealuminated Faujasite (DAF) zeolite-Y. CL and photoluminescence (PL) measurements are discussed on the background of the formation of nanoclusters in the open cages of the zeolite host structure. DAF was mixed with a SnCl2 solution and subsequently dried under stirring and annealed in H2- or O 2-ambient to establish metallic Sn or semiconducting SnO2 clusters in the zeolite pores. Samples with various nominal weight ratios were prepared, i.e. SnO2/DAF=0.15-0.8 and Sn/DAF=0.1-0.6. X-ray powder diffraction (XRD) analysis shows that the nominal incorporation of Sn or SnO2 resulted in weak reduction of the lattice constants. At 77 K all samples exhibit a strong CL signal in the blue spectral range, which was clearly visible by the eye, but no significant spectral properties which might be attributed to a nanocluster formation could be deduced. PL measurements at 77 K do not give significant verification of a cluster formation, too. One can conclude that the strong CL mainly originates from the DAF and that the incorporation of Sn or SnO2 clusters was either rather poor and/or has no significant influence on the luminescence behavior
Keywords :
X-ray diffraction; annealing; cathodoluminescence; lattice constants; nanostructured materials; photoluminescence; porous materials; zeolites; 77 K; Sn; SnO2; X-ray powder diffraction; annealing; cage structure; cathodoluminescence; dealuminated faujasite; drying; lattice constant; nanocluster formation; photoluminescence; porous material; stirring; zeolite; Annealing; Crystalline materials; Crystallization; Impurities; Lattices; Luminescence; Temperature; Tin; X-ray diffraction; X-ray scattering;
Conference_Titel :
Industrial Electronics Society, 1999. IECON '99 Proceedings. The 25th Annual Conference of the IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-5735-3
DOI :
10.1109/IECON.1999.822173