• DocumentCode
    1603459
  • Title

    On-board decoupling of cryptographic FPGA to improve tolerance to side-channel attacks

  • Author

    Iokibe, K. ; Amano, T. ; Toyota, Y.

  • Author_Institution
    Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Okayama, Japan
  • fYear
    2011
  • Firstpage
    925
  • Lastpage
    930
  • Abstract
    One of PI/EMC design techniques, on-board decoupling, was proved its possibility to be used as a countermeasure against cryptographic side-channel analysis attack. The on-board decoupling was applied to a side-channel attack standard evaluation board (SASEBO-G) involving a cryptographic FPGA that operated an AES-128 encryption process. Two decoupling conditions were examined. Radio frequency (RF) power current was detected with a current probe that was placed on a power cable connected to SASEBO-G for the cryptographic FPGA. Traces of the RF power current were recorded repeatedly with a digital oscilloscope until 30,000 traces were acquired in each decoupling condition. The traces were analyzed statistically by using the correlation power analysis (CPA). Results of CPA show that necessary number of traces to reveal the secret key significantly increased when the RF power current was attenuated by decoupling over the dominant frequency range in spectra of the RF power current. The decoupling technique can be useful as a countermeasure of side-channel analysis attacks to cryptographic modules.
  • Keywords
    cryptography; digital storage oscilloscopes; field programmable gate arrays; AES-128 encryption process; PI-EMC design techniques; correlation power analysis; cryptographic FPGA; cryptographic side-channel analysis attack; current probe; digital oscilloscope; on-board decoupling technique; power cable; radio frequency power current; side-channel attack standard evaluation board; Capacitors; Correlation; Current measurement; Encryption; Field programmable gate arrays; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
  • Conference_Location
    Long Beach, CA, USA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4577-0812-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2011.6038441
  • Filename
    6038441