DocumentCode
1603494
Title
Ultrastable cryogenic sapphire dielectric microwave resonators
Author
Mann, A.G. ; Luiten, A.N. ; Blair, D.G. ; Buckingham, M.J.
Author_Institution
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
fYear
1992
Firstpage
167
Lastpage
171
Abstract
Measurements of the properties of cryogenic sapphire resonators with various concentrations of paramagnetic ions are reported, and a new way of achieving self-compensation of temperature fluctuations for such resonators mounted inside conducting shields is described. It is shown that frequency-temperature self-compensation, in which the T4 temperature dependence of the sapphire dielectric constant compensates the effect of the T-1 Curie law of paramagnetic impurities, can be achieved at convenient operating temperatures around 6 K. Samples with a few ppm of chromium and iron impurity ions display strong influence on mode frequency and Q of nearby spin resonances at 11.45 GHz (Cr3+) and 12.05 GHz (Fe3+) and fail to compensate above the spin resonances. In samples with much reduced chromium and iron concentrations, an ion with a very high frequency paramagnetic resonance (such as Ti3+) has been exploited to obtain essentially frequency-independent self-compensation
Keywords
Q-factor; cavity resonators; compensation; cryogenics; dielectric resonators; frequency stability; microwave generation; microwave oscillators; sapphire; 11.45 GHz; 12.05 GHz; 4.2 K; Al2O3; Al2O3:Cr3+; Al2O3:Fe3+; Al2O3:Ti3+; Curie law; Q-factors; conducting shields; cryogenic sapphire resonators; dielectric constant; dielectric loaded; dielectric microwave resonators; microwave oscillators; mode frequency; self-compensation; spin resonances; temperature dependence; temperature fluctuations; ultrastable; very high frequency paramagnetic resonance; Chromium; Cryogenics; Dielectric measurements; Fluctuations; Frequency; Impurities; Iron; Paramagnetic materials; Paramagnetic resonance; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
Conference_Location
Hershey, PA
Print_ISBN
0-7803-0476-4
Type
conf
DOI
10.1109/FREQ.1992.270018
Filename
270018
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