• DocumentCode
    1603498
  • Title

    Aided image understanding system

  • Author

    Amo, Ana Del ; Farmer, Michael

  • Author_Institution
    GE Aviation, Digital Syst., Grand Rapids, MI
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Tools for automatic image understanding for damage assessment for environmental catastrophes or military operations are essential for managing operator workloads. The paper proposes a tool which integrates image segmentation and classification with the goal of providing accurate and timely information about the areas of study. Traditional methods involving image segmentation followed by classification have not lived up to their potential due to the inherent semantic gap between these two functions. Segmentation algorithms have been limited in their success in extracting objects of interest which in turn limits classification performance since the segmentation algorithm has no a priori knowledge of the objects in the image. Segmentation algorithms fail in one of two directions: (i) over-segmentation where the object of interest is divided into many smaller regions or (ii) under-segmentation where the object of interest is merged with irrelevant background information. Both problems can confound the classification process. The approach is demonstrated on aerial images from the Katrina disaster to be able to detect buildings that may have been damaged or displaced from their original positions.
  • Keywords
    image classification; image segmentation; automatic image understanding; damage assessment; environmental catastrophes; image classification; image segmentation; military operations; Classification algorithms; Clustering algorithms; Computer science; Data mining; Digital systems; Engineering management; Environmental management; Image segmentation; Military computing; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fuzzy Information Processing Society, 2008. NAFIPS 2008. Annual Meeting of the North American
  • Conference_Location
    New York City, NY
  • Print_ISBN
    978-1-4244-2351-4
  • Electronic_ISBN
    978-1-4244-2352-1
  • Type

    conf

  • DOI
    10.1109/NAFIPS.2008.4531266
  • Filename
    4531266