Title :
Low noise, microwave signal generation using cryogenic, sapphire dielectric resonators: an update
Author :
Driscoll, M.M. ; Weinert, R.W.
Abstract :
Results obtained using sapphire dielectric resonators for automatic frequency control (AFC) stabilization of an X-band surface acoustic wave resonator voltage-controlled oscillator (SAWR VCO)-based source are reported. The resonators are operated in a low order mode and employ high temperature superconducting films in the metal enclosure covers in order to obtain unloaded Q-factors of 3×105 to 5×105. Signal source flicker-of-frequency noise and noise floor levels are measured at X -band. The measured values for flicker-of-frequency noise are 10 dB poorer than anticipated, based on the large value of discriminator sensitivity obtained. Possible causes for current limitations in signal near-carrier spectral performance include resonator short-term frequency fluctuations resulting from environmentally induced effects and/or frequency-drive (AM-to-FM) effects. Resonator vibration sensitivities on the order of 1×10-8 per g are measured
Keywords :
automatic frequency control; cavity resonators; cryogenics; crystal resonators; dielectric resonators; frequency stability; microwave generation; microwave oscillators; random noise; sapphire; surface acoustic wave devices; variable-frequency oscillators; AFC stabilization; Al2O3; X-band SAW resonator VCO; cryogenic; current limitations; dielectric loaded; discriminator sensitivity; environmentally induced effects; flicker-of-frequency noise; frequency-drive effects; high temperature superconducting films; low noise; low order mode; microwave signal generation; noise floor levels; sapphire dielectric resonators; short-term frequency fluctuations; signal near-carrier spectral performance; 1f noise; Automatic frequency control; Cryogenics; Microwave generation; Noise generators; Noise level; Noise measurement; Signal generators; Superconducting device noise; Working environment noise;
Conference_Titel :
Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
Conference_Location :
Hershey, PA
Print_ISBN :
0-7803-0476-4
DOI :
10.1109/FREQ.1992.270020