DocumentCode
1603666
Title
Stability and reliability of thick film resistors constructed by different techniques
Author
Pietrikova, Alena ; Urbancik, Jan ; Slosarcik, Stanislav ; Bujalobokova, Magdalena ; Potencki, Jerzy ; Kolek, Andrzej
Author_Institution
Dept. of Technol. in Electron., Tech. Univ. of Kosice, Slovakia
Volume
2
fYear
2004
Firstpage
296
Abstract
Comparison of the stability and reliability of thick film resistors prepared by different techniques is discussed in this work. This aim was accomplished by comparison of the thick film resistors prepared by etching and conventional thick film technology. The etching technique as a combination of three techniques (photolithography, LTCC processing and PCB patterning technology) was introduced for construction of "planar" resistors as a new idea. We show that it is possible to develop devices that are useful in standard thick film technology and that it is possible to fabricate 3D (planar) resistors with higher stability and reliability. As operating material we selected low temperature co-fired ceramic (LTCC), because it allows the fabrication of three-dimensional structures, and it is compatible with the screen-printing process.
Keywords
ceramic packaging; electron device testing; etching; photolithography; printed circuits; reliability; stability; thick film resistors; 3D planar resistors; 3D structures; LTCC processing; PCB patterning technology; etching; low temperature co-fired ceramic; photolithography; reliability; screen-printing process; stability; thick film resistors; thick film technology; Ceramics; Chemical technology; Etching; Fabrication; Lithography; Resistors; Silicon; Stability; Temperature; Thick films;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. 27th International Spring Seminar on
Print_ISBN
0-7803-8422-9
Type
conf
DOI
10.1109/ISSE.2004.1490438
Filename
1490438
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