Title :
Fast face detection and localization from multi-views using statistical approach
Author :
Anvar, Seyed Mohammad Hassan ; Yau, Wei-Yun ; Teoh, Eam Khwang
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
Window-based face detection methods are fast. However their results are coarse, pose dependent and require fine face alignment for face analysis. Recently a statistical approach is introduced by Toews and Arbel [1], which is able to detect faces in multiple poses and does not require face alignment. However, their method is slow compared to the window-based method. In this paper, we proposed a method, which capable of detecting faces in multiple poses in near real time and also does not require face alignment. Experimental results show that our proposed method has comparable accuracy with the Toews and Arbel´s method but has significantly lower processing time.
Keywords :
face recognition; statistical analysis; face analysis; face localization; fast face detection; fine face alignment; pose dependence; processing time; statistical approach; window-based face detection; Face; Face detection; Feature extraction; Nose; Real time systems; Training; Face detection; localization; real-time; scale invariant feature; statistical method;
Conference_Titel :
Information, Communications and Signal Processing (ICICS) 2011 8th International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-0029-3
DOI :
10.1109/ICICS.2011.6173610