• DocumentCode
    1603717
  • Title

    Opportunities in the Risk Management of EMC

  • Author

    Armstrong, K.

  • Author_Institution
    Cherry Clough Consultants Ltd., Stafford, UK
  • fYear
    2011
  • Firstpage
    988
  • Lastpage
    993
  • Abstract
    It is not an exaggeration to say that we are witnessing the birth of a brand new industry Risk Management of electromagnetic compatibility (EMC) - which will be needed in most safety-related and high-reliability applications/industries. But at the moment there are (effectively) no resources available that can satisfy its requirements, either from EMC test laboratories or functional safety assessors. A great deal of work needs to be done to prepare manufacturing industry, test laboratories and safety assessors for these requirements, for which a large demand will build up by 2021. The new opportunities now available include: 1) Academic teaching at all levels 2) Academic research 3) Vocational training courses 4) Computer-aided simulation 5) Test methods and specialized test equipment 6) Verification/validation techniques other than testing 7) Development of policies and procedures 8) Safety Assessor services 9) Accreditation services. This paper briefly introduces the rapidly growing need for the above, and discusses each of these opportunities in turn.
  • Keywords
    electromagnetic compatibility; risk management; safety; telecommunication network reliability; EMC test laboratories; academic teaching; accreditation services; electromagnetic compatibility; functional safety assessors; high-reliability application-industry; risk management; vocational training courses; IEC standards; Immunity testing; Noise; Safety; Software; EMC; EMI; SmartGrid; automobiles; functional safety; high-reliability; medical devices; mission-critical; reliability; risk analysis; safety risks; safety-related; safetycritical; security; service robots;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
  • Conference_Location
    Long Beach, CA, USA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4577-0812-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2011.6038452
  • Filename
    6038452