DocumentCode :
1603717
Title :
Opportunities in the Risk Management of EMC
Author :
Armstrong, K.
Author_Institution :
Cherry Clough Consultants Ltd., Stafford, UK
fYear :
2011
Firstpage :
988
Lastpage :
993
Abstract :
It is not an exaggeration to say that we are witnessing the birth of a brand new industry Risk Management of electromagnetic compatibility (EMC) - which will be needed in most safety-related and high-reliability applications/industries. But at the moment there are (effectively) no resources available that can satisfy its requirements, either from EMC test laboratories or functional safety assessors. A great deal of work needs to be done to prepare manufacturing industry, test laboratories and safety assessors for these requirements, for which a large demand will build up by 2021. The new opportunities now available include: 1) Academic teaching at all levels 2) Academic research 3) Vocational training courses 4) Computer-aided simulation 5) Test methods and specialized test equipment 6) Verification/validation techniques other than testing 7) Development of policies and procedures 8) Safety Assessor services 9) Accreditation services. This paper briefly introduces the rapidly growing need for the above, and discusses each of these opportunities in turn.
Keywords :
electromagnetic compatibility; risk management; safety; telecommunication network reliability; EMC test laboratories; academic teaching; accreditation services; electromagnetic compatibility; functional safety assessors; high-reliability application-industry; risk management; vocational training courses; IEC standards; Immunity testing; Noise; Safety; Software; EMC; EMI; SmartGrid; automobiles; functional safety; high-reliability; medical devices; mission-critical; reliability; risk analysis; safety risks; safety-related; safetycritical; security; service robots;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
Conference_Location :
Long Beach, CA, USA
ISSN :
2158-110X
Print_ISBN :
978-1-4577-0812-1
Type :
conf
DOI :
10.1109/ISEMC.2011.6038452
Filename :
6038452
Link To Document :
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