Title :
Measurement technique for the extraction of differential S-parameters from single-ended S-parameters
Author :
Vaz, Ken ; Caggiano, Michael
Author_Institution :
Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
Abstract :
With the increasing implementation of communication devices and systems in the RF/low microwave ranges, along with the usage of differential signaling schemes, it has become necessary to develop practical methods to suitably characterize the operation of these devices. This paper describes a method of determining the four-port differential S-parameters of such networks with the use of two-port vector network analyzer (VNA) by the use of various terminating load combinations. With the aid of a general equation the single-ended S-parameters obtained using this technique can be readily manipulated to obtain the differential S-parameters. The device under test (DUT) chosen to validate this technique is a pair of coupled microstrip lines designed to each have an uncoupled characteristic impedance of 55 Ω and a differential impedance of 110 Ω at 1 GHz.
Keywords :
S-parameters; UHF measurement; coupled transmission lines; electric impedance; microstrip lines; microwave measurement; multiport networks; 1 GHz; RF range; coupled microstrip lines; device under test; differential impedance; differential signaling schemes; four-port differential S-parameters; low microwave range; single-ended S-parameters; two-port vector network analyzer; uncoupled characteristic impedance; Differential equations; Impedance; Measurement techniques; Microwave communication; Microwave devices; Microwave theory and techniques; RF signals; Radio frequency; Scattering parameters; Testing;
Conference_Titel :
Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. 27th International Spring Seminar on
Print_ISBN :
0-7803-8422-9
DOI :
10.1109/ISSE.2004.1490442