Title : 
Joint detection for space-time block-coded TD-CDMA systems
         
        
            Author : 
Wang, Ying Min ; Ran, Xiao Long ; Li, Shi He ; Yi, Ke Chu
         
        
            Author_Institution : 
Xidian Univ., Beijing, China
         
        
        
        
            fDate : 
6/24/1905 12:00:00 AM
         
        
        
            Abstract : 
Space-time (ST) coding offers an effective transmit diversity technique to combat fading, but most existing space-time coding schemes assume flat fading channels that may not be valid for wideband wireless mobile communications. For multiuser transmissions over multipath environment (frequency-selective fading channel), ST coding is challenging due to the presence of not only MAI (multiple access interference) but also ISI (intersymbol interference). In this paper, a novel ST block coding scheme based on block processing is proposed for TD-CDMA systems in frequency-selective channels, and block linear joint detection algorithms are developed. Then, we simplify these algorithms and get a low cost but good performance joint detection algorithm for spacetime block-coded TD-CDMA systems.
         
        
            Keywords : 
block codes; cellular radio; code division multiple access; diversity reception; fading channels; intersymbol interference; mobile radio; multipath channels; radiofrequency interference; ISI; MAI; TD-CDMA systems; block linear joint detection algorithms; fading channel; frequency-selective channels; intersymbol interference; joint detection; multipath environment; multiple access interference; multiuser transmissions; space-time block coding; transmit diversity technique; wideband wireless mobile communications; Block codes; Costs; Detection algorithms; Frequency; Frequency-selective fading channels; Intersymbol interference; Mobile communication; Multiple access interference; Wideband; Wireless communication;
         
        
        
        
            Conference_Titel : 
Vehicular Technology Conference, 2002. VTC Spring 2002. IEEE 55th
         
        
            Print_ISBN : 
0-7803-7484-3
         
        
        
            DOI : 
10.1109/VTC.2002.1002640