Title :
Lattice distortion and parameter variation in quartz and berlinite crystals: methods for improving the quality
Author :
Zarka, A. ; Capelle, B. ; Zheng, Y. ; Schwartzel, J. ; Detaint, J. ; Buisson, X. ; Toudic, Y.
Author_Institution :
LMCP, Paris, France
Abstract :
X-ray transmission topography and a plane-wave imaging technique using synchrotron radiation are employed to reveal lattice defects and to measure minute distortions in plates of synthetic quartz and berlinite crystals. For the berlinite, studies of the optimal conditions of growth are performed in order to obtain larger crystals. This is done using an extension of different techniques previously applied to quartz crystals. To control the quality of the obtained crystals, X-ray topographic studies are performed, and typical features of the samples are presented
Keywords :
X-ray diffraction examination of materials; aluminium compounds; crystal defects; lattice constants; quartz; AlPO4; SiO2; X-ray topographic studies; X-ray transmission topography; berlinite crystals; lattice defects; parameter variation; plane-wave imaging technique; quality; quartz; synchrotron radiation; Crystalline materials; Crystals; Distortion measurement; Lattices; Optical imaging; Reflection; Surfaces; Synchrotron radiation; X-ray diffraction; X-ray imaging;
Conference_Titel :
Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
Conference_Location :
Hershey, PA
Print_ISBN :
0-7803-0476-4
DOI :
10.1109/FREQ.1992.270042
