Title :
A heuristic for multiple weight set generation
Author :
Kim, Hong-Slk ; Lee, Jin-kyue ; Kang, Sungho
Author_Institution :
Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea
fDate :
6/23/1905 12:00:00 AM
Abstract :
The number of weighted random patterns depends on the number of deterministic test patterns with a low sampling probability. The weight set that is extracted from the deterministic pattern set with high sampling probability reduces the number of test patterns. In this paper we present a new deterministic pattern selection algorithm which generates high performance weight sets by removing deterministic patterns with low sampling frequencies. Simulation results using ISCAS 85 benchmark circuits prove the effectiveness of the new weight set generation algorithm
Keywords :
logic testing; deterministic pattern selection; deterministic test patterns; integrated circuits test; sampling probability; weight set; weighted random patterns; weighted random test generator; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Integrated circuit testing; Logic testing; Probabilistic logic; Probability; Sampling methods; Test pattern generators;
Conference_Titel :
Computer Design, 2001. ICCD 2001. Proceedings. 2001 International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-1200-3
DOI :
10.1109/ICCD.2001.955080
